Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)

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Online link	https://cmgds.marine.usgs.gov/catalog/whcmsc/open_file_report/ofr2002-152/QISO_meta.faq.html
Description	Mapping the thickness of the Quaternary sediment is useful for delineating the geologic framework of the New York Bight inner-continental shelf. This in turn aids in understanding the stratigraphic evolution of the inner-continental shelf, the regional sediment transport system, and the influence of the inner-shelf framework on coastal processes. The grid showing the thickness of Quaternary sediment is an important factor in the framework of the coastal region.
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